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"Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM ..."

Tian Xia et al. (2013)

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DOI: 10.1007/S10836-013-5414-8

access: closed

type: Journal Article

metadata version: 2023-03-26

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Tian Xia, Rohit Shetty, Timothy Platt, Mustapha Slamani:
Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique. J. Electron. Test. 29(6): 893-901 (2013)

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