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"Measurement selection for parametric IC fault diagnosis."

Angus Wu, Jack L. Meador (1994)

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DOI: 10.1007/BF00971959

access: closed

type: Journal Article

metadata version: 2020-09-11

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Angus Wu, Jack L. Meador:
Measurement selection for parametric IC fault diagnosis. J. Electron. Test. 5(1): 9-18 (1994)

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