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ORCID"Scan Test Response Compaction Combined with Diagnosis Capabilities."
Sverre Wichlund, Frank Berntsen, Einar J. Aas (2008)
- Sverre Wichlund, Frank Berntsen, Einar J. Aas:
Scan Test Response Compaction Combined with Diagnosis Capabilities. J. Electron. Test. 24(1-3): 235-246 (2008)
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