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"Process Deviations and Spot Defects: Two Aspects of Test and Test ..."
Carsten Wegener, Michael Peter Kennedy, Bernd Straube (2001)
- Carsten Wegener, Michael Peter Kennedy
, Bernd Straube:
Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits. J. Electron. Test. 17(5): 409-416 (2001)
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