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"The economics of scan-path design for testability."

Prab Varma, Tushar Gheewala (1994)

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DOI: 10.1007/BF00972078

access: closed

type: Journal Article

metadata version: 2020-09-11

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Prab Varma, Tushar Gheewala:
The economics of scan-path design for testability. J. Electron. Test. 5(2-3): 179-193 (1994)

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