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"Generation of Primary Input Blocking Pattern for Power Minimization during ..."

Wang-Dauh Tseng (2007)

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DOI: 10.1007/S10836-006-0098-Y

access: closed

type: Journal Article

metadata version: 2020-09-11

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Wang-Dauh Tseng:
Generation of Primary Input Blocking Pattern for Power Minimization during Scan Testing. J. Electron. Test. 23(1): 75-84 (2007)

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