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"Critical Path Selection for Delay Testing Considering Coupling Noise."

Rajeshwary Tayade, Jacob A. Abraham (2009)

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DOI: 10.1007/S10836-009-5105-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Rajeshwary Tayade, Jacob A. Abraham:
Critical Path Selection for Delay Testing Considering Coupling Noise. J. Electron. Test. 25(4-5): 213-223 (2009)

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