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"A Survey of Test Techniques for MCM Substrates."

Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee (1997)

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DOI: 10.1023/A:1008214330042

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/SwaminathanKC97
Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee:
A Survey of Test Techniques for MCM Substrates. J. Electron. Test. 10(1-2): 27-38 (1997)

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