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"Selecting measurements to test the functional behavior of analog circuits."

J. van Spaandonk, Tom A. M. Kevenaar (1996)

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DOI: 10.1007/BF00137561

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/SpaandonkK96
J. van Spaandonk, Tom A. M. Kevenaar:
Selecting measurements to test the functional behavior of analog circuits. J. Electron. Test. 9(1-2): 9-18 (1996)

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