"Reducing Test Time in the High-Volume Production of Analog Circuits using ..."

Mustapha Slamani, Karim Arabi (2001)

Details and statistics

DOI: 10.1023/A:1012755219655

access: closed

type: Journal Article

metadata version: 2020-09-11

a service of  Schloss Dagstuhl - Leibniz Center for Informatics