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"Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed ..."

Oleg Semenov, Arman Vassighi, Manoj Sachdev (2003)

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DOI: 10.1023/A:1023713517064

access: closed

type: Journal Article

metadata version: 2020-09-11

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Oleg Semenov, Arman Vassighi, Manoj Sachdev:
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta I_DDQ Testing. J. Electron. Test. 19(3): 341-352 (2003)

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