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"A realistic defect oriented testability methodology for analog circuits."

Manoj Sachdev (1995)

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DOI: 10.1007/BF00996436

access: closed

type: Journal Article

metadata version: 2020-09-11

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Manoj Sachdev:
A realistic defect oriented testability methodology for analog circuits. J. Electron. Test. 6(3): 265-276 (1995)

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