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"Scan Test Strategy for Asynchronous-Synchronous Interfaces."

Octavian Petre, Hans G. Kerkhoff (2004)

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DOI: 10.1007/S10677-004-4251-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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Octavian Petre, Hans G. Kerkhoff:
Scan Test Strategy for Asynchronous-Synchronous Interfaces. J. Electron. Test. 20(6): 639-645 (2004)

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