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"Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a ..."

Joonsung Park, Hongjoong Shin, Jacob A. Abraham (2011)

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DOI: 10.1007/S10836-011-5227-6

access: closed

type: Journal Article

metadata version: 2020-09-11

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Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J. Electron. Test. 27(3): 321-334 (2011)

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