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"Model for Transient Fault Susceptibility of Combinational Circuits."

Martin Omaña, Daniele Rossi, Cecilia Metra (2004)

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DOI: 10.1023/B:JETT.0000042514.37566.6D

access: closed

type: Journal Article

metadata version: 2022-11-20

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  - https://dblp.org/rec/journals/et/OmanaRM04
Martin Omaña, Daniele Rossi, Cecilia Metra:
Model for Transient Fault Susceptibility of Combinational Circuits. J. Electron. Test. 20(5): 501-509 (2004)

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