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"Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and ..."
Ondrej Novák et al. (2004)
- Ondrej Novák, Zdenek Plíva
, Jiri Nosek, Andrzej Hlawiczka, Tomasz Garbolino
, Krzysztof Gucwa:
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor. J. Electron. Test. 20(1): 109-122 (2004)
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