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"Optimization Methods for Post-Bond Testing of 3D Stacked ICs."

Brandon Noia, Krishnendu Chakrabarty, Erik Jan Marinissen (2012)

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DOI: 10.1007/S10836-011-5233-8

access: closed

type: Journal Article

metadata version: 2024-02-05

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Brandon Noia, Krishnendu Chakrabarty, Erik Jan Marinissen:
Optimization Methods for Post-Bond Testing of 3D Stacked ICs. J. Electron. Test. 28(1): 103-120 (2012)

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