"Trade-offs in scan path and BIST implementations for RAMs."

Michael Nicolaidis, O. Kebichi, Vladimir Castro Alves (1994)

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DOI: 10.1007/BF00972087

access: closed

type: Journal Article

metadata version: 2020-09-11

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Michael Nicolaidis, O. Kebichi, Vladimir Castro Alves:
Trade-offs in scan path and BIST implementations for RAMs. J. Electron. Test. 5(2-3): 273-283 (1994)

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