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"Partial Reset Methodology and Experiments for Improving Random-Pattern ..."

Huy Nguyen, Rabindra K. Roy, Abhijit Chatterjee (1999)

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DOI: 10.1023/A:1008366304699

access: closed

type: Journal Article

metadata version: 2020-09-11

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Huy Nguyen, Rabindra K. Roy, Abhijit Chatterjee:
Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits. J. Electron. Test. 14(3): 259-272 (1999)

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