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"Economic Analysis of Test Process Flows for Multichip Modules Using Known ..."

Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn (1997)

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DOI: 10.1023/A:1008239018655

access: closed

type: Journal Article

metadata version: 2020-09-11

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Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn:
Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. J. Electron. Test. 10(1-2): 151-166 (1997)

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