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"Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and ..."

Yukiya Miura, Jiro Kato (2008)

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DOI: 10.1007/S10836-007-5022-6

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yukiya Miura, Jiro Kato:
Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X - Y Zoning Method. J. Electron. Test. 24(1-3): 223-233 (2008)

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