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"Evaluating the Impact of Temperature on Dynamic Fault Behaviour of ..."

G. Cardoso Medeiros et al. (2019)

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DOI: 10.1007/S10836-019-05784-1

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/MedeirosBPCB19
G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen:
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. 35(2): 191-200 (2019)

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