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"RTL Test Justification and Propagation Analysis for Modular Designs."

Yiorgos Makris, Alex Orailoglu (1998)

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DOI: 10.1023/A:1008301720070

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yiorgos Makris, Alex Orailoglu:
RTL Test Justification and Propagation Analysis for Modular Designs. J. Electron. Test. 13(2): 105-120 (1998)

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