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"A test generation program for sequential circuits."

Enrico Macii, Angelo Raffaele Meo (1994)

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DOI: 10.1007/BF00971967

access: closed

type: Journal Article

metadata version: 2020-09-11

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Enrico Macii, Angelo Raffaele Meo:
A test generation program for sequential circuits. J. Electron. Test. 5(1): 115-119 (1994)

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