Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM."

Kun-Lun Luo et al. (2016)

> Home

Details and statistics

DOI: 10.1007/S10836-016-5570-8

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/LuoWHC16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/LuoWHC16
Kun-Lun Luo, Ming-Hsueh Wu, Chun-Lung Hsu, Chen-An Chen:
Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM. J. Electron. Test. 32(2): 111-123 (2016)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.