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"Fault-Aware Dependability Enhancement Techniques for Phase Change Memory."

Shyue-Kung Lu et al. (2021)

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DOI: 10.1007/S10836-021-05961-1

access: closed

type: Journal Article

metadata version: 2021-12-15

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Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun:
Fault-Aware Dependability Enhancement Techniques for Phase Change Memory. J. Electron. Test. 37(4): 503-513 (2021)

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