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"Defect Analysis and Defect Tolerant Design of Multi-port SRAMs."

Lushan Liu et al. (2008)

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DOI: 10.1007/S10836-007-5023-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Lushan Liu, Pradeep Nagaraj, Shambhu J. Upadhyaya, Ramalingam Sridhar:
Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. J. Electron. Test. 24(1-3): 165-179 (2008)

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