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"Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST."

Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich (2002)

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DOI: 10.1023/A:1014993509806

access: closed

type: Journal Article

metadata version: 2020-09-11

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Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich:
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. J. Electron. Test. 18(2): 159-170 (2002)

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