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"Reduction of Number of Paths to be Tested in Delay Testing."
Huawei Li, Zhongcheng Li, Yinghua Min (2000)
- Huawei Li, Zhongcheng Li, Yinghua Min:
Reduction of Number of Paths to be Tested in Delay Testing. J. Electron. Test. 16(5): 477-485 (2000)
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