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"Self-test of sequential circuits with deterministic test pattern sequences."

Arno Kunzmann, Frank Böhland (1994)

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DOI: 10.1007/BF00972090

access: closed

type: Journal Article

metadata version: 2020-09-11

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Arno Kunzmann, Frank Böhland:
Self-test of sequential circuits with deterministic test pattern sequences. J. Electron. Test. 5(2-3): 307-312 (1994)

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