"Distributed Test Pattern Generation for Stuck-At Faults in Sequential ..."

Peter A. Krauss, Andreas Ganz, Kurt Antreich (1997)

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DOI: 10.1023/A:1008266422380

access: closed

type: Journal Article

metadata version: 2020-09-11

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Peter A. Krauss, Andreas Ganz, Kurt Antreich:
Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits. J. Electron. Test. 11(3): 227-245 (1997)

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