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"Design for Delay Testability in High-Speed Digital ICs."

Hans G. Kerkhoff et al. (2001)

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DOI: 10.1023/A:1012207210784

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/KerkhoffSSS01
Hans G. Kerkhoff, Han Speek, M. Shashani, Manoj Sachdev:
Design for Delay Testability in High-Speed Digital ICs. J. Electron. Test. 17(3-4): 225-231 (2001)

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