"Physics-Based Low-Cost Test Technique for High Voltage LDMOS."

Sukeshwar Kannan et al. (2013)

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DOI: 10.1007/S10836-013-5417-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi:
Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electron. Test. 29(6): 745-762 (2013)

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