"Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs."

Tanusree Kaibartta, G. P. Biswas, Debesh Kumar Das (2020)

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DOI: 10.1007/S10836-020-05872-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Tanusree Kaibartta, G. P. Biswas, Debesh Kumar Das:
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs. J. Electron. Test. 36(2): 239-253 (2020)

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