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"Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement."

Sisir Kumar Jena, Santosh Biswas, Jatindra Kumar Deka (2021)

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DOI: 10.1007/S10836-021-05980-Y

access: closed

type: Journal Article

metadata version: 2022-02-23

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Sisir Kumar Jena, Santosh Biswas, Jatindra Kumar Deka:
Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement. J. Electron. Test. 37(5): 633-652 (2021)

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