"Effect of Noise on Analog Circuit Testing."

Madhu K. Iyer, Michael L. Bushnell (1999)

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DOI: 10.1023/A:1008343108840

access: closed

type: Journal Article

metadata version: 2020-09-11

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Madhu K. Iyer, Michael L. Bushnell:
Effect of Noise on Analog Circuit Testing. J. Electron. Test. 15(1-2): 11-22 (1999)

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