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"Sequential Circuits with Combinational Test Generation Complexity under ..."

Michiko Inoue, Emil Gizdarski, Hideo Fujiwara (2002)

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DOI: 10.1023/A:1013728006805

access: closed

type: Journal Article

metadata version: 2020-09-11

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Michiko Inoue, Emil Gizdarski, Hideo Fujiwara:
Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption. J. Electron. Test. 18(1): 55-62 (2002)

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