"Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph ..."

Cong Hu et al. (2016)

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DOI: 10.1007/S10836-016-5565-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Cong Hu, Zhi Li, Chuan-pei Xu, Mengyi Jia:
Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test Clocks. J. Electron. Test. 32(1): 31-42 (2016)

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