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"Test Set and Fault Partitioning Techniques for Static Test Sequence ..."

Michael S. Hsiao, Srimat T. Chakradhar (2000)

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DOI: 10.1023/A:1008313901938

access: closed

type: Journal Article

metadata version: 2020-09-11

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Michael S. Hsiao, Srimat T. Chakradhar:
Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits. J. Electron. Test. 16(4): 329-338 (2000)

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