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"Testing Disturbance Faults in Various NAND Flash Memories."

Chih-Sheng Hou, Jin-Fu Li (2014)

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DOI: 10.1007/S10836-014-5487-Z

access: closed

type: Journal Article

metadata version: 2023-10-17

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Chih-Sheng Hou, Jin-Fu Li:
Testing Disturbance Faults in Various NAND Flash Memories. J. Electron. Test. 30(6): 643-652 (2014)

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