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"Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect ..."

Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault (2019)

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DOI: 10.1007/S10836-019-05832-W

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - journals/et/HasibST19
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Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault:
Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality Metrics. J. Electron. Test. 35(6): 823-838 (2019)

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