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"Test Generation for Bridging Faults in Reversible Circuits Using ..."

Mousum Handique, Santosh Biswas, Jatindra Kumar Deka (2019)

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DOI: 10.1007/S10836-019-05811-1

access: closed

type: Journal Article

metadata version: 2020-09-11

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Mousum Handique, Santosh Biswas, Jatindra Kumar Deka:
Test Generation for Bridging Faults in Reversible Circuits Using Path-Level Expressions. J. Electron. Test. 35(4): 441-457 (2019)

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