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"Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, ..."
Said Hamdioui, Ad J. van de Goor (2000)
- Said Hamdioui, Ad J. van de Goor:
Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy. J. Electron. Test. 16(5): 487-498 (2000)
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