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"Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests."

Said Hamdioui et al. (2003)

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DOI: 10.1023/A:1022802010738

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - journals/et/HamdiouiAGR03
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  - https://dblp.org/rec/journals/et/HamdiouiAGR03
Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers:
Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests. J. Electron. Test. 19(2): 195-205 (2003)

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