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"Wavelet Neural Network Approach for Testing of Switched-Current Circuits."

Jierong Guo, Yigang He, Meirong Liu (2011)

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DOI: 10.1007/S10836-011-5248-1

access: closed

type: Journal Article

metadata version: 2020-09-11

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Jierong Guo, Yigang He, Meirong Liu:
Wavelet Neural Network Approach for Testing of Switched-Current Circuits. J. Electron. Test. 27(5): 611-625 (2011)

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