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"Fast and Automated Electromigration Analysis for CMOS RF PA Design."

Junjie Gu et al. (2017)

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DOI: 10.1007/S10836-016-5639-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/GuFNZM17
Junjie Gu, Haipeng Fu, Weicong Na, Qijun Zhang, Jianguo Ma:
Fast and Automated Electromigration Analysis for CMOS RF PA Design. J. Electron. Test. 33(1): 133-140 (2017)

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