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"Effective march algorithms for testing single-order addressed memories."

Ad J. van de Goor, Yervant Zorian (1994)

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DOI: 10.1007/BF00972518

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - journals/et/GoorZ94
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Ad J. van de Goor, Yervant Zorian:
Effective march algorithms for testing single-order addressed memories. J. Electron. Test. 5(4): 337-345 (1994)

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