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"A Test Generation Methodology for Interconnection Opens Considering ..."

Roberto Gómez, Alejandro Girón, Víctor H. Champac (2008)

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DOI: 10.1007/S10836-008-5085-Z

access: closed

type: Journal Article

metadata version: 2021-01-22

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Roberto Gómez, Alejandro Girón, Víctor H. Champac:
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. J. Electron. Test. 24(6): 529-538 (2008)

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