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"Memory Reliability Improvement Based on Maximized Error-Correcting Codes."

Valentin Gherman, Samuel Evain, Yannick Bonhomme (2013)

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DOI: 10.1007/S10836-013-5396-6

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/GhermanEB13
Valentin Gherman, Samuel Evain, Yannick Bonhomme:
Memory Reliability Improvement Based on Maximized Error-Correcting Codes. J. Electron. Test. 29(4): 601-608 (2013)

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