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"A Unified DFT Approach for BIST and External Test."

Marie-Lise Flottes, Christian Landrault, A. Petitqueux (2003)

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DOI: 10.1023/A:1021943912494

access: closed

type: Journal Article

metadata version: 2020-09-11

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Marie-Lise Flottes, Christian Landrault, A. Petitqueux:
A Unified DFT Approach for BIST and External Test. J. Electron. Test. 19(1): 49-60 (2003)

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